Neuer Detektorkopf von Bruker Nano ergänzt Instrumente für SEM
OPTIMUS™ TKD detector head complements unique 5-on-1 range of instruments for SEM
Bruker’s high performance e-Flash EBSD detector series can now be configured with the OPTIMUS™ TKD detector head which was specifically designed for best sample-detector geometry for Transmission Kikuchi Diffraction analysis (TKD) in SEM. The detector head not only acquires Kikuchi patterns with unmatched sensitivity, but even provides access to SAED (Selected Area Electron Diffraction) like patterns.
It is equipped with the ARGUS™ imaging system that enables brilliant dark field and bright field imaging with details down to nanometer scale, practically transforming your SEM into a TEM.
The OPTIMUS™ TKD detector head seamlessly works with Bruker’s TKD Professional Toolkit for SEM including TKD sample holder, the XFlash® EDS detector series for simultaneous TKD/EDS measurements and the ESPRIT 2 analytical software suite.
For more information visit www.bruker.com/optimus-tkd.