Companies / Institutes

RTG Mikroanalyse GmbH

Schwarzschildstraße 1, 12489 Berlin

+49 30 6392-1146
+49 30 6392-1147


Herr Dr. Peter Helm


Herren Dr. Peter Helm, Dr. Peter Gehrmann, Dr. Peter Jörchel


microanalysis by means of Secondary Ion Mass Spectrometry (SIMS)
measurement of depth profiles (quantitative and qualitative)
impurity analysis
lateral element distribution
three-dimensional analysis

material composition
Semiconductor materials
optical multilayers
solar cells
metal layers structures
and many more