SENTECH Thin Film Metrology Workshop
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SENTECH Instruments GmbH
Johann-Hittorf-Str./James-Franck-Str.,
12489 Berlin
Bring your non-confidential thin film samples and work side-by-side with SENTECH’s application and development experts. Discover how ellipsometry, transmission and reflectometry can enhance your measurement and characterisation capabilities.
Workshop highlights
- Interactive lectures by experts from SENTECH Instruments
- Live demonstrations using the SENTECH cutting-edge SpectraRay/4 software
- Hands-on practical sessions – apply techniques to your own samples
- Networking opportunities, including a hosted dinner